Sindex™ chips provide a smooth, flat, silicon surface with indexed locations at the micro scale for easy sample location and relocation.  These surfaces can be modified with a variety of metal coatings and chemistry options.  They are compatible with atomic force microscopy, florescence microscopy, electron microscopy, and NSOM.

Sindex™  chips are offered in two grades:

AFM grade—one out of every 10 chips will be imaged by AFM to ensure that they meet the roughness specification and no particles are larger than 20 nm.

Optical grade—one out of every 10 chips inspected by optics and no particles present are larger than 1 mm.